By Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.)
Whole trend becoming, Rietveld research, and Calculated Diffraction styles. Quantitative section research via XRay Diffraction (XRD). skinny movie and floor Characterization by way of XRD. Lattice Defects and XRay Topography. Texture research via XRD. XRD Instrumentation, ideas, and Reference fabrics. rigidity selection by means of Diffraction tools. XRD Profile becoming, Crystallite dimension and pressure choice. XRD functions: Detection Limits, Superconductors, Organics, Minerals. Mathematical tools in XRay Spectrometry (XRS). skinny movie and floor Characterization via XRS and XPS. overall mirrored image XRS. XRS thoughts and Instrumentation. XRS functions. XRay Imaging and Tomography. 161 articles. Index.
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Extra info for Advances in X-Ray Analysis: Volume 35B
The system as shown in a previous paper (Gardner, and Hawthorne, 1975) is typical ofradioisotope source excited energy dispersive X-ray analyzers. The excitation source is either l09Cd or 55Fe depending on the elements to be measured. One pure titanium sample, two known alloy samples from NIST, and one aluminium alloy sample of known composition from ALCOA are used as test samples to validate the Monte Carlo results. T. HE ET AL. ~:,: ' . ~;:t<;';':'~':: . .... ~ 5 10 ' 20 15 25 30 Energy (kev) fig.
The analysis procedure is as follows: (a) (b) (c) (d) (e) Corresponding to approach (11) theoretical calculations are executed for all available compositions of samples (unknowns). By means of simple binary specimens the equipment is calibrated in accordance with theoretical calculations. Calculations of concentrations for all analyzed elements are fulfilled beginning from fluorescence, which is nearest to exciting radiation, and then step by step for all others. For all elements which have enhancement effects, the contribution of secondary and tertiary fluorescence to measured intensity is calculated and the intensity of primarily fluorescence is picked out.
R. P. Gardner, and K. Verghese, 1990, "MCPT: A Monte Carlo Code for Simulation of Photon Transport in Tomographic Scanners", Nuclear Instruments and Methods in Physics Research A299, 516-523. , 265-288. , 1973, Atomic Data Tables, 5, 51-111. , M. Mickael, T. P. Gardner, "A New Analysis Principle for EDXRF: the Monte Carlo - Library Least-Squares Principle", Advances in X-Ray Analysis, Vol. 31, pp. 461-469. Yacout, A. P. Gardner, and K. Verghese, 1984, "Cubic Spline Techniques for Fitting X-Ray Cross Sections", Nuclear Instruments and Methods in Physics Research, 220, 461-472.